In situ experiments with high voltage electron microscopes /

Bibliographic Details
Corporate Author: International Symposium on "Behavior of Lattice Imperfections in Materials--In Situ Experiments with HVEM"
Other Authors: Fujita, Hiroshi
Format: Conference Proceeding Book
Language:English
Published: Osaka, Japan : Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, [1985]
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: QH212.E4 S54 1985
 
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QH212.E4 S54 1985 Available