Cover Image

In situ experiments with high voltage electron microscopes /

Bibliographic Details
Corporate Author: International Symposium on "Behavior of Lattice Imperfections in Materials--In Situ Experiments with HVEM"
Other Authors: Fujita, Hiroshi
Format: Conference Proceeding Book
Language:English
Published: Osaka, Japan : Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, [1985]
Subjects:
High-voltage electron microscopes.
Description
Item Description:"Proceedings of the International Symposium on "Behavior of Lattice Imperfections in Materials--In Situ Experiments with High Voltage Electron Microscopes (HVEM)", Osaka University, which was held in November 18- 20, 1985"--Pref.
Added title page: Behavior of lattice imperfections in materials; in situ experiments with high voltage electron microscopes.
Physical Description:xxvi, 507 pages : illustrations ; 27 cm.
Bibliography:Includes bibliographies and author index.
ISBN:4990006518