| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
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| 001 |
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| 005 |
20151007052414.0 |
| 008 |
870324s1987 nyu b 00110 eng |
| 010 |
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|a 87008319
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| 020 |
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|a 0471851353
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|a (OCoLC)15518748
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| 050 |
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|a TK7868.D5
|b C67 1987
|
| 082 |
0 |
|
|a 621.3815/48
|2 19
|
| 100 |
1 |
|
|a Cortner, J. Max.
|
| 245 |
1 |
0 |
|a Digital test engineering /
|c J. Max Cortner.
|
| 264 |
|
1 |
|a New York :
|b Wiley,
|c 1987.
|
| 300 |
|
|
|a xiv, 337 pages ;
|c 25 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 500 |
|
|
|a "A Wiley-Interscience publication."
|
| 504 |
|
|
|a Includes bibliographies and index.
|
| 650 |
|
0 |
|a Digital electronics.
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing.
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| 999 |
|
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|a Texas A&M University
|b Rellis Campus
|c Joint Library Facility
|d Remote Storage
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|e TK7868.D5 C67 1987
|h Library of Congress classification
|i unmediated -- volume
|m A14811035691
|
| 998 |
f |
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|a TK7868.D5 C67 1987
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