rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Defect recognition and image processing in III-V compounds, II
    sub title: proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27- 29, 1987
  name:
    name part: International Symposium on Defect Recognition and Image Processing in III-V Compounds 1987 : Monterey, Calif.)
    role:
      role term: creator
  name:
    name part: Weber, Eicke R.
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: ne
    date issued: 1987
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: x, 320 pages : illustrations
  note: edited by Eicke R. Weber.
  note: Includes index.
  note: Bibliography: pages 318-320.
  subject:
    topic: Semiconductors
    topic: Defects
    genre: Congresses
  subject:
    topic: Gallium arsenide semiconductors
    genre: Congresses
  subject:
    topic: Image processing
    genre: Congresses
  classification: TK7871.85 .I5825 1987
  classification: 621.3815/2
  related item:
    title info:
      title: Materials science monographs ; 44
  identifier: 0444428925 :
  identifier: 87027177
  record info:
    record content source: DLC
    record creation date: 870911
    record change date: 20151007051829.0
    record identifier: in00000012441