Robust regression and outlier detection /

Bibliographic Details
Main Author: Rousseeuw, Peter J.
Other Authors: Leroy, Annick M.
Format: Book
Language:English
Published: New York : Wiley, [1987]
Series:Wiley series in probability and mathematical statistics. Applied probability and statistics.
Subjects:

MARC

Tag First Indicator Second Indicator Subfields
LEADER 00000cam a2200000 a 4500
001 in00000010979
005 20151007051948.0
008 870323s1987 nyua b 00110 eng
010 |a  87008234  
020 |a 0471852333 
035 |a (OCoLC)15518367 
035 |9 AAA5646AM 
040 |a DLC  |c DLC  |d TXA  |d UtOrBLW 
049 |a TXAM  |c [A12639066] 
050 0 0 |a QA278.2  |b .R68 1987 
082 0 |a 519.5/36  |2 19 
100 1 |a Rousseeuw, Peter J. 
245 1 0 |a Robust regression and outlier detection /  |c Peter J. Rousseeuw, Annick M. Leroy. 
264 1 |a New York :  |b Wiley,  |c [1987] 
264 4 |c ©1987 
300 |a xiv, 329 pages :  |b illustrations ;  |c 24 cm. 
336 |a text  |b txt  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
490 1 |a Wiley series in probability and mathematical statistics. Applied probability and statistics,  |x 0271-6356 
504 |a Bibliography: pages 292-310. 
500 |a Includes index. 
650 0 |a Regression analysis. 
650 0 |a Outliers (Statistics) 
650 0 |a Least squares. 
700 1 |a Leroy, Annick M. 
830 0 |a Wiley series in probability and mathematical statistics.  |p Applied probability and statistics. 
999 |a MARS 
999 f f |s f7f68411-4fb1-3146-b0b7-254f777c43f5  |i 2b5d7149-8136-3433-bc8a-39c26e727602  |t 0 
952 f f |p normal  |a Texas A&M University  |b College Station  |c Sterling C. Evans Library  |d Evans: Library Stacks  |t 0  |e QA278.2 .R68 1987  |h Library of Congress classification  |i unmediated -- volume  |m A14812639066 
998 f f |a QA278.2 .R68 1987  |t 0  |l Evans: Library Stacks